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专利名称：Terahertz wave measurement device and
method
发明人：Takayuki Hasebe,Hitoshi Tabata,Shigeru
Kitamura
申请号：US13857249申请日：20130405公开号：US069805B2公开日：20150303
专利附图：
摘要：The base plate is transmissive to terahertz waves, and a sample is disposed atthe base plate. In the conductive periodic structure, plural transmission portions that
transmit terahertz waves are arrayed with a predetermined period. The conductiveperiodic structure is disposed apart from a position at which the sample is disposed. Thewaveguide includes a total reflection surface provided at a boundary face with theconductive periodic structure. The total reflection surface totally reflects incidentterahertz waves, and the waveguide guides incident terahertz waves toward the totalreflection surface. The magnitudes of one or more of a distance between the position atwhich the sample is disposed and the conductive periodic structure, a property of thebase plate, and the predetermined period are set such that a dip showing a characteristicabsorption is formed in a predetermined frequency region of a spectrum of terahertzwaves.
申请人：Takayuki Hasebe,Hitoshi Tabata,Shigeru Kitamura
地址：Tokyo JP,Tokyo JP,Kyoto JP
国籍：JP,JP,JP
代理机构：Morgan, Lewis & Bockius LLP
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